Defects - Recognition imaging and physics in semiconductors 1999 - Proceedings of the eighth international conference on defects - Recognition, imaging and physics in semiconductors - Narita, Japan, September 15-18, 1999 - Preface

Authors
Ogawa, T Tajima, M
Citation
T. Ogawa et M. Tajima, Defects - Recognition imaging and physics in semiconductors 1999 - Proceedings of the eighth international conference on defects - Recognition, imaging and physics in semiconductors - Narita, Japan, September 15-18, 1999 - Preface, J CRYST GR, 210(1-3), 2000, pp. VIII-VIII
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
210
Issue
1-3
Year of publication
2000
Pages
VIII - VIII
Database
ISI
SICI code
0022-0248(200003)210:1-3<VIII:D-RIAP>2.0.ZU;2-D