A SURVEY OF TEST TECHNIQUES FOR MCM SUBSTRATES

Authors
SWAMINATHAN M KIM B CHATTERJEE A
Citation
M. Swaminathan et al., A SURVEY OF TEST TECHNIQUES FOR MCM SUBSTRATES, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 10(1-2), 1997, pp. 27-38
Citations number
14
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS → ACNP
ISSN journal
09238174
Volume
10
Issue
1-2
Year of publication
1997
Pages
27 - 38
Database
ISI
SICI code
0923-8174(1997)10:1-2<27:ASOTTF>2.0.ZU;2-1
Abstract
This paper provides a survey of MCM substrate test techniques. Test te chniques that are based on capacitance, resistance, electron beam, lat ent opens, time domain network analysis (TDNA) and RF resonator are di scussed. In this paper, test techniques are applied to interconnect te sting.