This paper explores strategies for fabricating and maintaining a sharp atom
ic force microscope (AFM) tip suitable for AFM data storage applications. T
o this end, AFM cantilevers have been incorporated into micromachined sled
carriers and air-bearing sliders. These supports act to limit the maximum l
oading force on the AFM tip and allow for improved vibration immunity for t
he AFM cantilever in comparison to macroscopic loading schemes. Readback fr
om a patterned rotating disk has been demonstrated using these devices, Sil
icon-carbide AFM cantilevers with diamond tips have been fabricated in a pr
ocess compatible with that of the sleds and sliders. Molded silicon-nitride
tips defined by the intersection of three surfaces have also been fabricat
ed for AFM cantilevers, The molds for plane-plane-concave tips are defined
by two silicon {111} planes and a silicon-dioxide curved surface. By geomet
ry, the three surfaces necessarily hare a unique intersection point, which
mag improve the consistency in sharpness of these tips relative to conventi
onal pyramidal tips.[485].