Indium thin film (similar to 20 nm) deposited on intrinsic lead sulfide fil
ms leads to the formation of an n-type composite layer when annealed in nit
rogen atmosphere at 350-400 degrees C, The formation of metallic lead and i
ndium oxide is observed in the X-ray diffraction patterns of the films. The
dark conductivity of the PbS + In films after nitrogen annealing at 400 de
grees C attains a value of 500 Omega(-1) cm(-1), which is higher by five or
ders of magnitude compared with as-prepared PbS films. Modifications in the
optical and electrical properties of PbS + In films after annealing are at
tributed to the presence of metallic lead and indium oxide in the films. (C
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