X-ray photoelectron spectroscopic studies of electrodeposited mercury cadmium telluride semiconductor thin films

Mercury cadmium telluride (MCT) polycrystalline thin films were grown by el ectrodeposition technique, at varying conditions. The X-ray photoelectron s pectroscopic (XPS) studies have been carried out on MCT thin films to analy ze the quality and nature of the films. The various elements present and th e surface contamination in electrodeposited MCT films were identified. The chemical states of the various elements present were studied and their quan tification was also carried out. The deposition conditions were identified for growing the MCT films of specific compositions. (C) 2000 Published by E lsevier Science Ltd. All rights reserved.