In-plane aligned YBCO film on textured YSZ buffer layer deposited on NiCr alloy tape by laser ablation with only O+ ion beam assistance

Authors
Huang, XT Wang, YQ Wang, QL Chen, QM
Citation
Xt. Huang et al., In-plane aligned YBCO film on textured YSZ buffer layer deposited on NiCr alloy tape by laser ablation with only O+ ion beam assistance, J PHYS-COND, 12(5), 2000, pp. 761-764
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS-CONDENSED MATTER
ISSN journal
09538984 → ACNP
Volume
12
Issue
5
Year of publication
2000
Pages
761 - 764
Database
ISI
SICI code
0953-8984(20000207)12:5<761:IAYFOT>2.0.ZU;2-U
Abstract
High critical current density and in-plane aligned YBa2Cu3O7-x, (YBCO) film on a textured yttria-stabilized zirconia (YSZ) buffer layer deposited on N iCr alloy (Hastelloy c-275) tape by laser ablation with only O+ ion beam as sistance was fabricated. The values of the x-ray phi-scan full width at hal f-maximum (FWHM) for YSZ(202) and YBCO(103) are 18 degrees and 11 degrees, respectively. The critical current density of YBCO film is 7.9 x 10(5) A cm (-2) at liquid nitrogen temperature and zero field, and its critical temper ature is 90 K.