Characterization of non-Gaussian rough surface scattering

Citation
Mk. Tsay et al., Characterization of non-Gaussian rough surface scattering, J CHIN I EN, 23(2), 2000, pp. 185-196
Citations number
13
Categorie Soggetti
Engineering Management /General
Journal title
JOURNAL OF THE CHINESE INSTITUTE OF ENGINEERS
ISSN journal
02533839 → ACNP
Volume
23
Issue
2
Year of publication
2000
Pages
185 - 196
Database
ISI
SICI code
0253-3839(200003)23:2<185:CONRSS>2.0.ZU;2-S
Abstract
In this paper, we examine the scattering properties of rough differently co rrelated surfaces using the IEM model. The effective correlation length of such a surface is pointed out and its effect on the backscattering behavior is discussed. It may be found from the cases considered here that the non- Gaussian effects are very significant even with the same correlation length and height variance. This can be seen From the surface spectra where the r oughness scales are distributed. Among the non-Gaussian correlated surfaces , the exponential correlated has more small scale roughness at the high fre quency components.