Doping of organic light emitting diodes (OLEDs) has well-established benefi
ts such as tuning emission wavelengths, as well as enhancing device lifetim
e and quantum efficiency. The use of low percentage doping within the emiss
ive layer is an established tool for the study of energy transfer processes
in OLEDs, allowing one to trace electron and hole movement and exciton for
mation. Delta doping, in which a thin layer of the dopant material alone is
incorporated in the device, has the added advantage of a thinner sensing l
ayer and an electroluminescence spectrum distinct from that of the host mat
erial. In an ongoing effort to further our understanding of electroluminesc
ent emission processes, we have fabricated multilayer OLEDs which incorpora
te a narrow (<1 nm) delta-doped DCM region within the emissive layer. The d
evices studied were deposited on indium tin oxide (ITO) on glass substrates
using thermal evaporation, with a structure of ITO, TPD (40 nm)/selectivel
y doped Alq(3) (40 nm)/Al (100 nm). The relationship between the doping pro
file and the emission characteristics will be discussed. (C) 2000 American
Vacuum Society. [S0734-2101(00)02002-9].