Fabrication of parallel quantum point contacts with submicron airbridges

Citation
Y. Feng et al., Fabrication of parallel quantum point contacts with submicron airbridges, J VAC SCI A, 18(2), 2000, pp. 730-733
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
18
Issue
2
Year of publication
2000
Pages
730 - 733
Database
ISI
SICI code
0734-2101(200003/04)18:2<730:FOPQPC>2.0.ZU;2-Z
Abstract
An airbridge technique was developed and subsequently employed to fabricate mesoscopic devices, such as parallel quantum point contacts. The airbridge technique mainly involves two different electron sensitive polymers, polym ethylglutarimide and polymethyl methacrylate. The airbridge was patterned b y electron beam lithography and metal lift-off with bilayer resist. Conduct ance measurements were performed on the devices at low magnetic fields. The results confirmed both the presence of the elliptical antidot as a negativ e voltage was applied to the center gate, as well as the nonintrusive natur e of the airbridge technique. [S073P2101(00)02502-1].