CAPILLARITY DRIVEN MOTION OF SOLID FILM WEDGES

Citation
H. Wong et al., CAPILLARITY DRIVEN MOTION OF SOLID FILM WEDGES, Acta materialia, 45(6), 1997, pp. 2477-2484
Citations number
20
Categorie Soggetti
Material Science","Metallurgy & Metallurigical Engineering
Journal title
ISSN journal
13596454
Volume
45
Issue
6
Year of publication
1997
Pages
2477 - 2484
Database
ISI
SICI code
1359-6454(1997)45:6<2477:CDMOSF>2.0.ZU;2-T
Abstract
A solid film freshly deposited on a substrate may form a non-equilibri um contact angle with the substrate, and will evolve. This morphologic al evolution near the contact line is investigated by studying the mot ion of a solid wedge on a substrate. The contact angle of the wedge ch anges at time t = 0 from the wedge angle alpha to the equilibrium cont act angle beta, and its effects spread into the wedge via capillarity- driven surface diffusion. The film profiles at different times are fou nd to be self-similar; with the length scale increasing as t(1/4). The self-similar film profile is determined numerically by a shooting met hod for alpha and beta between 0 and 180 degrees. In general, we find that the film remains a wedge when alpha = beta. For alpha < beta, the film retracts, whereas for alpha > beta, the film extends. For alpha = 90 degrees, the results describe the growth of grain-boundary groove s for arbitrary dihedral angles. For beta = 90 degrees, the solution a lso applies to a free-standing wedge, and the thin-wedge profiles agre e qualitatively with those observed in transmission electron microscop e specimens. (C) 1997 Acta Metallurgica Inc.