Measurement of material uniformity using 3-D position sensitive CdZnTe gamma-ray spectrometers

Citation
Z. He et al., Measurement of material uniformity using 3-D position sensitive CdZnTe gamma-ray spectrometers, NUCL INST A, 441(3), 2000, pp. 459-467
Citations number
6
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
441
Issue
3
Year of publication
2000
Pages
459 - 467
Database
ISI
SICI code
0168-9002(20000301)441:3<459:MOMUU3>2.0.ZU;2-I
Abstract
We present results from two 1 cm(3) CdZnTe gamma-ray spectrometers with ful l 3-D position sensitivity. To our knowledge, these are the first reported semiconductor spectrometers that provide independent spectral data for each of over 2000 volume elements. Energy resolutions of 1.5-1.6% FWHM and posi tion resolutions of 0.7 x 0.7 x 0.5 mm were obtained at 662 keV gamma-ray e nergy from the central region of both detectors for single-pixel events. Wi th the 3-D position sensing capability variations in spectral response over the detector volume were recorded using a Cs-137 source. These measurement s allow a study of full-energy peak efficiency, mean ionization energy and electron trapping as a function of 3-D position. The effects of material no n-uniformity on detector spectroscopic performance are discussed. (C) 2000 Elsevier Science B.V. All rights reserved.