A versatile and sensitive instrument has been developed that is capable of
measuring the percentage change in resistance for giant magnetoresistance (
GMR) thin films as a function of applied magnetic field, drive current or t
ime. The system is designed to have high resolution and minimum noise throu
gh optimised design and choice of components. The resistance changes in a t
hin film are detected indirectly by the system using a four-point in-line p
robe or by direct measurement of patterned samples. (C) 2000 Elsevier Scien
ce S.A. All rights reserved.