There is a need for chemically resistant coatings that protect the exposed
surface of microfluidics components. Pinhole free films with low stress and
a good uniformity on flat and inclined surfaces are required. In this stud
y, amorphous silicon carbide (SiC) thin films have been deposited by RF mag
netron sputtering on hat surfaces and into micromachined cavities of Si (10
0). The variation of RF power, deposition pressure and substrate bias volta
ge have been studied. Depending on the deposition conditions, the film stre
ss can be adjusted from - 1400 MPa to + 100 MPa. Modifications of the depos
ition rate and the morphology between normal and inclined (54.7 degrees) pl
anes have been observed. Optimal chemical stability was found with slightly
compressive (-100 MPa) SiC thin films. No degradation of the protective la
yer has been observed after 3 h in KOH at 80 degrees C. (C) 2000 Elsevier S
cience S.A. All rights reserved.