PERSISTENT SPECTRAL-HOLE BURNING IN THE WIDE-GAP SEMICONDUCTOR SIC DOPED WITH VANADIUM

Citation
R. Kummer et al., PERSISTENT SPECTRAL-HOLE BURNING IN THE WIDE-GAP SEMICONDUCTOR SIC DOPED WITH VANADIUM, Optics letters, 22(12), 1997, pp. 916-918
Citations number
8
Categorie Soggetti
Optics
Journal title
ISSN journal
01469592
Volume
22
Issue
12
Year of publication
1997
Pages
916 - 918
Database
ISI
SICI code
0146-9592(1997)22:12<916:PSBITW>2.0.ZU;2-1
Abstract
Persistent spectral-hole burning was performed in the gamma line of V4 + in the side-gap semiconductor 6H-SiC. Spectral holes burned at 11 K were stable to temperatures of at least 320 K for several days. The ho le-burning mechanism consists of two-step photoionization of V4+ (self -gated spectral-hole burning). The spectral holes could be erased opti cally, either by pumping of electrons back from stable traps or, presu mably, by a charge-transfer transition from the valence band to the V5 + ions. (C) 1997 Optical Society of America.