Shearing orientation dependence of cleavage step structures on GaAs(110)

Citation
T. Okui et al., Shearing orientation dependence of cleavage step structures on GaAs(110), SURF SCI, 448(2-3), 2000, pp. 219-224
Citations number
10
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
448
Issue
2-3
Year of publication
2000
Pages
219 - 224
Database
ISI
SICI code
0039-6028(20000310)448:2-3<219:SODOCS>2.0.ZU;2-H
Abstract
Scanning tunneling microscopy has been used to evaluate surface roughness a nd step structures of cleaved GaAs(110) surfaces. It is found that they ape dependent on the direction of the force applied during cleaving. The flatt est surface having fairly straight [111]-type steps is obtained when cleavi ng samples toward the [110] direction. Cleaving samples toward [001] also l eads to smooth surfaces with [001]-, [112]-, and/or [114]-type steps. In co ntrast, when cleaving samples toward [112] or [114], the surfaces obtained have many fluctuated atomic steps. We will discuss the observed shearing or ientation dependence of the cleavage step structures in terms of configurat ions of As-Ga bonds. (C) 2000 Published by Elsevier Science B.V. All rights reserved.