Shearing orientation dependence of cleavage step structures on GaAs(110)
Citation
T. Okui et al., Shearing orientation dependence of cleavage step structures on GaAs(110), SURF SCI, 448(2-3), 2000, pp. 219-224
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
SICI code
0039-6028(20000310)448:2-3<219:SODOCS>2.0.ZU;2-H
Abstract
Scanning tunneling microscopy has been used to evaluate surface roughness a
nd step structures of cleaved GaAs(110) surfaces. It is found that they ape
dependent on the direction of the force applied during cleaving. The flatt
est surface having fairly straight [111]-type steps is obtained when cleavi
ng samples toward the [110] direction. Cleaving samples toward [001] also l
eads to smooth surfaces with [001]-, [112]-, and/or [114]-type steps. In co
ntrast, when cleaving samples toward [112] or [114], the surfaces obtained
have many fluctuated atomic steps. We will discuss the observed shearing or
ientation dependence of the cleavage step structures in terms of configurat
ions of As-Ga bonds. (C) 2000 Published by Elsevier Science B.V. All rights
reserved.