Highly-resolved measurement of extended technical surfaces with scalable topometry

Citation
W. Osten et al., Highly-resolved measurement of extended technical surfaces with scalable topometry, TEC MES, 66(11), 1999, pp. 413-428
Citations number
34
Categorie Soggetti
Instrumentation & Measurement
Journal title
TECHNISCHES MESSEN
ISSN journal
01718096 → ACNP
Volume
66
Issue
11
Year of publication
1999
Pages
413 - 428
Database
ISI
SICI code
0171-8096(199911)66:11<413:HMOETS>2.0.ZU;2-P
Abstract
The wide-scale inspection of extended technical components with respect to typical surface features (shape, texture, roughness) needs the combined app lication of different measurement techniques together with new tools for th e consistent analysis and description of the measuring results. The new con cept of scaled topometry meets the demands of wide-scale surface topometry Controlled by the evaluation of scale-independent surface features based on fractal geometry, different measurement techniques with subsequent lateral and depth resolution are applied. As a result a complete description of th e surface is given taking into account special regions of interest. The cho ice and the orientation of the special measurement technique is supported b y a new feature extraction method based upon the principle of the fractal p yramid. The advantages of the new concept are demonstrated on the example o f a ceramic plate with surface faults.