Wavelength-dependent measurement and evaluation of surface topographies: application of a new concept of window roughness and surface transfer function
M. Wieland et al., Wavelength-dependent measurement and evaluation of surface topographies: application of a new concept of window roughness and surface transfer function, WEAR, 237(2), 2000, pp. 231-252
The technological performance of surfaces in fields such as tribology, bioc
ompatibility and optics is often highly dependent on surface topography and
roughness. The common practice of applying 'integral' roughness parameters
, however, is often an incomplete and unsatisfactory way to describing surf
ace topographies. Wavelength-dependent roughness evaluation is shown to be
a successful method for the description of surface topographies in various
characteristic roughness ranges, as well as being a useful indicator of the
effect of surface treatment processes. This study examined the effects of
common cut-off (COF) (high- and low-frequency) and average filtering (AFT)
as well as fast Fourier transformation (FFT) techniques, as applied to synt
hetic and experimental profiles. Furthermore, the relationship between the
roughness value R-q and the amplitudes C-n of the FFT power spectrum is dem
onstrated. To characterize a particular surface process consisting of sever
al consecutive processes, a surface treatment transfer function is defined
using individual FFT coefficients C-n(x) for each surface treatment step. T
o illustrate the application for industrial surfaces, two-dimensional (2-D)
profiles on a micromachined steel surface (calibration sample) as well as
on lacquered car body sheet and titanium implant surfaces were measured wit
h a non-contact laser profilometer (LPM) and evaluated. FFT is shown to be
a powerful method for the calculation of the wavelength-dependent roughness
, as well as for the back-transformation of partial data sets into profiles
in predefined wavelength ranges ("window roughness"). The more conventiona
l filter methods give similar results, but some information are lost due to
the fact that they do not correspond to a set of orthonormal functions. Th
e concept of wavelength-dependent ("window") roughness parameters is demons
trated to be a concept that allows for a much more detailed description of
surface topographical properties with two main merits: (a) it allows macros
copic physico-technological properties to be correlated with roughness cont
ributions in selected wavelength ranges; (b) the overall effect of consecut
ive surface treatment processes can be separated into wavelength-dependent
contributions from each treatment step. The concept is demonstrated for con
secutive surface treatment processes in the pretreatment and lacquering of
aluminium car body sheet and for blasting and etching processes in the case
of titanium medical implants. (C) 2000 Elsevier Science S.A. All rights re
served.