Epitaxial SrRuO3 (SRO) thin films were deposited by pulsed laser deposition
on LaAlO3(100) and Si(100) substrates, A study of the influence of substra
te temperature and oxygen partial pressure on the structural and electrical
properties is presented for films deposited on LaAlO3(100). The dependence
of the properties of SRO on film thickness was also studied. The crystal p
roperties improved when a SrTiO3 (STO) seed layer was used, although the su
rface of the SRO films deposited on this layer had a high density of outgro
wths. SRO thin films deposited on Si(100) were epitaxial when an yttria-sta
bilised zirconia (YSZ) buffer layer was used. The crystal structure and mor
phology of these films was determined. (C) 2000 Elsevier Science B.V. All r
ights reserved.