We report on the synthesis of carbon nitride thin films using ArF excimer l
aser (lambda = 193 nm) irradiation of acetylene and ammonia gaseous mixture
s. The influence of the precursor composition on the nitrogen incorporation
in the films was investigated by different techniques, namely X-ray photoe
lectron spectrometry (XPS), low-energy electron induced X-ray spectrometry
(LEEIXS) and IR spectrometry. Scanning electron microscopy was used to char
acterise the microstructure of the deposited films. As shown by XPS the N/C
atomic ratio varies by changing the precursor composition and reaches a ma
ximum of 0.75 for a flow rate ratio NH3:C2H2 = 5:1. Nitrogen as revealed by
Fourier transform infrared spectrometry (FTIR) is single or double chemica
lly bonded to carbon. The morphology of the deposited films investigated by
scanning electron microscopy (SEM) depends also on the deposition paramete
rs. (C) 2000 Elsevier Science B.V. All rights reserved.