Optically induced defects in vitreous silica

Citation
S. Juodkazis et al., Optically induced defects in vitreous silica, APPL SURF S, 154, 2000, pp. 696-700
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
154
Year of publication
2000
Pages
696 - 700
Database
ISI
SICI code
0169-4332(200002)154:<696:OIDIVS>2.0.ZU;2-7
Abstract
We report the observation of photoluminescence (PL) in optically damaged vi treous silica (v-SiO2) and its gradual decrease by annealing at temperature range from room temperature to 773 K. Optical damage was induced by tightl y focused picosecond or femtosecond irradiation inside v-SiO2. FL bands at 280, 470 and 650 nm were observed. The PL can be excited by 250 nm irradiat ion, which corresponds to the absorption band of the oxygen vacancy, V-O. T he decrease of PL with annealing is explained by structural modifications o f the defects in the damaged area. (C) 2000 Elsevier Science B.V. All right s reserved.