Evidence for the solubility of boron in graphite by electron energy loss spectroscopy

Citation
V. Serin et al., Evidence for the solubility of boron in graphite by electron energy loss spectroscopy, CARBON, 38(4), 2000, pp. 547-554
Citations number
25
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CARBON
ISSN journal
00086223 → ACNP
Volume
38
Issue
4
Year of publication
2000
Pages
547 - 554
Database
ISI
SICI code
0008-6223(2000)38:4<547:EFTSOB>2.0.ZU;2-W
Abstract
We present the results of transmission electron microscopy (TEM) and electr on energy loss spectrometry (EELS) studies on two carbon-boron alloys both prepared by chemical vapour deposition at ca. 1000 degrees C and differing in their [Boron]/[Carbon] atomic ratio as well as in their morphology. In b oth samples, impurity concentrations, principally oxygen and nitrogen, were found to be low relative to boron dopant levels, For low boron contents, t ypically around 5-10 at.%, the sample consisted of union-like spherical par ticles approximately 10 nm in diameter which exhibited a non-homogeneous di stribution of boron, concentrated at a level of 5-6 at.% in the centre. For this sample, studies of the B-K- and C-K-ELNES (electron energy loss near- edge structure) together with associated modelling of the unoccupied densit y of electronic states, indicate a substitution of boron atoms on threefold coordinated spl-sites within the graphite network. For higher boron doping levels, typically 25 at.%, the sample consisted of homogeneous thin films. In this case, the change in shape of the B-K-ELNES indicates that boron ha s higher coordinations than planar trigonal together with possibly some res idual sp(2) sites. This study unambiguously demonstrates the presence of bo ron substitution solely within an sp(2)-bonded graphite network in the case of low boron contents and, when combined with other studies, gives an indi cation of the solubility limit for boron in graphite for the chemical vapou r deposition (CVD) process. (C) 2000 Elsevier Science Ltd. All rights reser ved.