A three-dimensional (3-D) solder liquid formation model is developed for pr
edicting the geometry, the restoring force and the reliability of solder jo
ints in an area array of interconnects [e.g., ball grid array (BGA), flip c
hip] with various pad configurations. In general, the restoring force and t
he reliability of the solder joints depend on the thermal-mechanical behavi
or of the solder, the geometry of the solder ball, and the geometry layout/
material properties of the package. A good solder pad configuration could l
ead to a larger restoring force along the gravitational direction (a higher
standoff height and a blunter contact angle) with better reliability chara
cteristics achieved. In this research, a second-reflow-process approach is
applied for the reliability enhancement of typical EGA assemblies, includin
g PBGA and SuperBGA assemblies. The results show that for a typical PBGA as
sembly, the ratio of the enhancement by application of the second-reflow-pr
ocess approach is 2.03 based on the Coffin-Manson criterion and 1.4 based o
n the energy density based method, and more significantly, for a typical Su
perBGA assembly, it is 7.17 and 2.422, respectively.