On enhancing eutectic solder joint reliability using a second-reflow-process approach

Citation
Kn. Chiang et al., On enhancing eutectic solder joint reliability using a second-reflow-process approach, IEEE T AD P, 23(1), 2000, pp. 9-14
Citations number
11
Categorie Soggetti
Material Science & Engineering
Journal title
IEEE TRANSACTIONS ON ADVANCED PACKAGING
ISSN journal
15213323 → ACNP
Volume
23
Issue
1
Year of publication
2000
Pages
9 - 14
Database
ISI
SICI code
1521-3323(200002)23:1<9:OEESJR>2.0.ZU;2-S
Abstract
A three-dimensional (3-D) solder liquid formation model is developed for pr edicting the geometry, the restoring force and the reliability of solder jo ints in an area array of interconnects [e.g., ball grid array (BGA), flip c hip] with various pad configurations. In general, the restoring force and t he reliability of the solder joints depend on the thermal-mechanical behavi or of the solder, the geometry of the solder ball, and the geometry layout/ material properties of the package. A good solder pad configuration could l ead to a larger restoring force along the gravitational direction (a higher standoff height and a blunter contact angle) with better reliability chara cteristics achieved. In this research, a second-reflow-process approach is applied for the reliability enhancement of typical EGA assemblies, includin g PBGA and SuperBGA assemblies. The results show that for a typical PBGA as sembly, the ratio of the enhancement by application of the second-reflow-pr ocess approach is 2.03 based on the Coffin-Manson criterion and 1.4 based o n the energy density based method, and more significantly, for a typical Su perBGA assembly, it is 7.17 and 2.422, respectively.