In situ mesa etching and immediate regrowth in a HVPE reactor for buried heterostructure device fabrication

Citation
Er. Messmer et al., In situ mesa etching and immediate regrowth in a HVPE reactor for buried heterostructure device fabrication, J CRYST GR, 210(4), 2000, pp. 600-612
Citations number
8
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
210
Issue
4
Year of publication
2000
Pages
600 - 612
Database
ISI
SICI code
0022-0248(200003)210:4<600:ISMEAI>2.0.ZU;2-U
Abstract
Mesa etching in a hydride vapour-phase epitaxy (HVPE) reactor has been stud ied. Etched depth. underetching and shape of the mesas have been analysed a s a function of partial pressures of active gases (HCl, PPI, and InCl) stri pe orientation and etching temperature. The experimental results show that the depth and undercut can be etched independently. We propose qualitative mechanisms for etching each of the emerging crystallographic planes ((0 0 1 ), ( 1 1 0) and {1 1 1}). In situ mesa etching with immediate regrowth was applied to the fabrication of buried heterostructure Fabry-Perot lasers. No surface contamination due to exposure to ambient and low process time are advantages of this technique. (C) 2000 Elsevier Science B.V. All rights res erved.