Characterization of lattice defects in strontium titanate single crystals by X-ray topography and transmission electron microscopy

Lattice defects in SrTiO3 single crystals were characterized by X-ray topog raphy and transmission electron microscopy. We examined two groups of cryst als whose lapped facts were (001) and (011), respectively. After taking X-r ay topographs, crystals which included relatively many defects were chosen for detailed investigation by transmission electron microscopy, which gave the following results: (i) some subgrain boundaries observed by X-ray topog raphy were small-angle tilt boundaries; and (ii) many dislocations were fou nd in the region where thick line contrast was observed in X-ray topographs . Most of them had <100> type Burgers vectors.