Molecular structure and conformational composition of decamethyl-n-tetrasilane, Si4Me10, by gas electron diffraction and density functional theory calculations
Av. Belyakov et al., Molecular structure and conformational composition of decamethyl-n-tetrasilane, Si4Me10, by gas electron diffraction and density functional theory calculations, J ORGMET CH, 597(1-2), 2000, pp. 87-91
Density functional theory calculations on n-Si4Me10 at the B3PW91/6-311G* l
evel indicate six minima on the potential-energy surface corresponding to t
wo anti conformers with phi(SiSiSiSi) dihedral angles of +/- 160 degrees, t
wo gauche conformers with phi = +/- 57 degrees, and two orthogonal conforme
rs with phi = +/- 92 degrees. The relative energies of the three conformers
were calculated to be 0.0 (anti), 2.9 (gauche) and 3.0 kJ mol(-1) (orthogo
nal). Least-squares refinements on gas electron diffraction data recorded a
t room temperature yielded the mole fractions chi(anti) = 0.51(6), chi(gauc
he) = 0.32(8) and chi(ortho) = 0.17(14). The data thus confirm the presence
of the anti and gauche conformers, while the presence of the ortho is prob
able but not certain. The main bond distances and Valence angles of the mos
t prevalent (anti) conformer are (calc./exp.): Si(1)-Si(2) = 237.1/235.0(6)
ppm; Si(2)-Si(3) = 237.4/235.4(6) ppm; Si(1)-C = 189.5/189.3(2) ppm; Si(2)
-C = 190.3/190.1(2) ppm; Si(1)Si(2)Si(3)= 112.5/112.4(5)degrees. (C) 2000 E
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