Characterization of (Ti1-xAlx)N films prepared by radio frequency reactivemagnetron sputtering

Citation
Jy. Rauch et al., Characterization of (Ti1-xAlx)N films prepared by radio frequency reactivemagnetron sputtering, J EUR CERAM, 20(6), 2000, pp. 795-799
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY
ISSN journal
09552219 → ACNP
Volume
20
Issue
6
Year of publication
2000
Pages
795 - 799
Database
ISI
SICI code
0955-2219(200005)20:6<795:CO(FPB>2.0.ZU;2-3
Abstract
(Ti1-xAlx)N films were deposited by radio frequency reactive magnetron sput tering on a high speed steel substrate. The structure and composition of th e coatings were analysed by various techniques. Hardness and adhesion of th e films were investigated using Vickers micro-indentation and scratch test respectively, whereas their tribological properties were studied using a pi n-on-disk tribometer. The results show that increasing aluminium content le ads to increase hardness of the films and to decrease their wear resistance when sliding against a magnesia-stabilized zirconia ball. On the contrary, no clear dependence of the film adhesion on the aluminium concentration wa s detected. (C) 2000 Elsevier Science Ltd. All rights reserved.