Electromagnetic analysis of axially symmetric diffractive lenses with the method of moments

Authors
Prather, DW Shi, S
Citation
Dw. Prather et S. Shi, Electromagnetic analysis of axially symmetric diffractive lenses with the method of moments, J OPT SOC A, 17(4), 2000, pp. 729-739
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
ISSN journal
10847529 → ACNP
Volume
17
Issue
4
Year of publication
2000
Pages
729 - 739
Database
ISI
SICI code
1084-7529(200004)17:4<729:EAOASD>2.0.ZU;2-P
Abstract
We present the electromagnetic analysis of axially symmetric diffractive le nses. Analysis is performed by numerically solving the electric and magneti c held integral equations using the method of moments, and it exploits axia l symmetry to reduce computational cost. Formulations for the analysis of l ossless dielectric and perfectly conducting lenses are presented. The analy sis of binary and eight-level lenses are performed to illustrate the utilit y of the technique. (C) 2000 Optical Society of America [S0740-3 232(00)011 04-2] OCIS code: 050.1970.