Two different types of dry refining and bulk formation processes and thin f
ilm formation by the Gas Deposition Method have been studied using GD-MS, I
GF-IR, N-2 Carrier Gas Extraction Method and CPAA, from view point of purif
ication. Aluminum purification using liquid/solid phase under high vacuum a
nd bulk formation of high purity tungsten by CVD method have been successfu
lly achieved. The purity level of the purified aluminum is nearly 6N in met
allics with extremely low hydrogen and oxygen contents (min. 40 ppb). The p
urity level of CVD-W succeeds more than 7N in metallics with extremely low
oxygen contents (3.2 ppm) having high relative density 99.80%. Copper thin
films formed by the Gas Deposition Method have higher purity, as purificati
on mechanism works till and during film formation, and the resistivity of f
ilm, 20 n Omega . m, is very close to that of the bulk.