14th International Congress on Electron Microscopy (EELS/ELNES/EXELFS special issue)

Authors
Jouffrey, B Egerton, R
Citation
B. Jouffrey et R. Egerton, 14th International Congress on Electron Microscopy (EELS/ELNES/EXELFS special issue), MICRON, 31(4), 2000, pp. 323-323
Categorie Soggetti
Multidisciplinary
Journal title
MICRON
ISSN journal
09684328 → ACNP
Volume
31
Issue
4
Year of publication
2000
Pages
323 - 323
Database
ISI
SICI code
0968-4328(200008)31:4<323:1ICOEM>2.0.ZU;2-4