Carbon nanotubes as probes for atomic force microscopy

Citation
Rmd. Stevens et al., Carbon nanotubes as probes for atomic force microscopy, NANOTECHNOL, 11(1), 2000, pp. 1-5
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
NANOTECHNOLOGY
ISSN journal
09574484 → ACNP
Volume
11
Issue
1
Year of publication
2000
Pages
1 - 5
Database
ISI
SICI code
0957-4484(200003)11:1<1:CNAPFA>2.0.ZU;2-#
Abstract
Tip-derived artifacts remain one of the chief limitations of atomic force m icroscopy (AFM) when attempting to measure sub-nanometre structures. Carbon nanotubes represent ideal structures for use as AFM tips because of their small diameter, high aspect ratio and high strength. We attached single car bon nanotube AFM tips using a novel are discharge method. Using these modif ied tips, we successfully imaged a protein filament found in sponge spicule s of Tethya aurantia. We report a modular stave-like structure for the prot ein filament that was previously unobservable with conventional AFM cantile vers.