Atomic force microscope for direct comparison measurement of step height and crystalline lattice spacing (vol 10, pg 380, 1999)

Authors
Fujii, T Imabori, K Kawakatsu, H Watanabe, S Bleuler, H
Citation
T. Fujii et al., Atomic force microscope for direct comparison measurement of step height and crystalline lattice spacing (vol 10, pg 380, 1999), NANOTECHNOL, 11(1), 2000, pp. 45-45
Citations number
1
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
NANOTECHNOLOGY
ISSN journal
09574484 → ACNP
Volume
11
Issue
1
Year of publication
2000
Pages
45 - 45
Database
ISI
SICI code
0957-4484(200003)11:1<45:AFMFDC>2.0.ZU;2-E