Metallic low-temperature resistivity in a 2D electron system over an extended temperature range

Citation
Sv. Kravchenko et Tm. Klapwijk, Metallic low-temperature resistivity in a 2D electron system over an extended temperature range, PHYS REV L, 84(13), 2000, pp. 2909-2912
Citations number
12
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
84
Issue
13
Year of publication
2000
Pages
2909 - 2912
Database
ISI
SICI code
0031-9007(20000327)84:13<2909:MLRIA2>2.0.ZU;2-4
Abstract
We report measurements of the zero-field resistivity in a dilute 2D electro n system in silicon at temperatures down to 35 mK. This extends the previou sly explored range of temperatures in this system by almost an order of mag nitude. On the metallic side, the resistivity near the metal-insulator tran sition continues to decrease with decreasing temperature and shows no low-t emperature upturn. At the critical electron density, the resistivity is fou nd to be temperature independent in the entire temperature range from 35 mK to 1 K.