Authors
Citation
Sh. Cohen, Special section on atomic force microscopy/scanning tunneling microscopy -Introduction, SCANNING, 22(1), 2000, pp. I-I
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
SCANNING
ISSN journal
01610457
→ ACNP
Volume
22
Issue
1
Year of publication
2000
Pages
I - I
Database
ISI
SICI code
0161-0457(200001/02)22:1<I:SSOAFM>2.0.ZU;2-J