The improvement of atomic force microscope suitable for magnetic domain structure measurements

Authors
Sveklo, I Dobrogowski, W Kisielewski, M Maziewski, A
Citation
I. Sveklo et al., The improvement of atomic force microscope suitable for magnetic domain structure measurements, ACT PHY P A, 97(3), 2000, pp. 527-530
Citations number
2
Categorie Soggetti
Physics
Journal title
ACTA PHYSICA POLONICA A
ISSN journal
05874246 → ACNP
Volume
97
Issue
3
Year of publication
2000
Pages
527 - 530
Database
ISI
SICI code
0587-4246(200003)97:3<527:TIOAFM>2.0.ZU;2-1
Abstract
Based on commercial Burleigh METRIS(TM)-2000 Atomic Force Microscope two me thods of magnetic force measurements were realised. The developed system wa s successfully applied for study of magnetic structure of both YIG-garnet a nd CoNi/Pt magneto-optic multilayers.