Talbot array illuminator for single-shot measurements of laser-induced-damage thresholds of thin-film coatings

Citation
C. Siegel et al., Talbot array illuminator for single-shot measurements of laser-induced-damage thresholds of thin-film coatings, APPL OPTICS, 39(10), 2000, pp. 1493-1499
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
39
Issue
10
Year of publication
2000
Pages
1493 - 1499
Database
ISI
SICI code
0003-6935(20000401)39:10<1493:TAIFSM>2.0.ZU;2-K
Abstract
A highly efficient Talbot array illuminator for single-shot, laser-induced- damage test measurements of optical thin-film coatings is proposed. With a periodic binary phase grating, a laser beam is transformed into an ensemble of Gaussian-like spots, which are known as the Fresnel image of the gratin g. For this purpose hexagonal phase gratings were fabricated and analyzed. With a peak fluence distribution of similar to 1 order of magnitude, the da mage threshold of thin films can be deduced by use of the data from only a single shot. (C) 2000 Optical Society of America.