Sampling period criterion in a scanning-beam technique

Citation
Ca. Schrama et Ewm. Van Der Ham, Sampling period criterion in a scanning-beam technique, APPL OPTICS, 39(10), 2000, pp. 1500-1504
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
39
Issue
10
Year of publication
2000
Pages
1500 - 1504
Database
ISI
SICI code
0003-6935(20000401)39:10<1500:SPCIAS>2.0.ZU;2-2
Abstract
The scanning-beam technique for measuring the response of a detector to an irradiance is analyzed. With this method the irradiance responsivity is det ermined by integration of the spatial responsivity. Since in practice the i ntegration is approximated by a summation over steps with a finite step siz e, errors are introduced. It is shown both theoretically and experimentally that the error vanishes when the reciprocal step size lies beyond the diff raction limit. Furthermore, comparison shows that experiment and theory are in good agreement. (C) 2000 Optical Society of America.