Phase-modulated beams technique for thin photorefractive films characterization

Authors
Barmenkov, YO Kir'yanov, AV Starodumov, AN Kozhevnikov, NM Lemmetyinen, H
Citation
Yo. Barmenkov et al., Phase-modulated beams technique for thin photorefractive films characterization, APPL PHYS L, 76(14), 2000, pp. 1801-1803
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
14
Year of publication
2000
Pages
1801 - 1803
Database
ISI
SICI code
0003-6951(20000403)76:14<1801:PBTFTP>2.0.ZU;2-X
Abstract
The phase-modulated beams technique is developed for nonlinear thin photore fractive films characterization. In the Raman-Nath diffraction approximatio n, the formulas are deduced, allowing us to measure the amplitude of phase grating recorded in a film and its nonlinear refractive index n(2). The met hod is applied for studying Langmuir-Blodgett multilayer thin (similar to 0 .6 mu m) films of Bacteriorhodopsin at wavelength 633 nm. (C) 2000 American Institute of Physics. [S0003-6951(00)02514-6].