A CCD area detector for X-ray diffraction under high pressure for rotatinganode source

Details of a two-dimensional X-ray area detector developed using a charge c oupled device, a image intensifier and a fibre optic taper are given. The d etector system is especially optimized for angle dispersive X-ray diffracti on set up using rotating anode generator as X-ray source. The performance o f this detector was tested by successfully carrying out powder X-ray diffra ction measurements on various materials such as intermetallics AuIn2, AuGa2 , high Z material Pd and low Z scatterer adamantane (C10H16) at ambient con ditions. Its utility for quick detection of phase transitions at high press ures with diamond anvil cell is demonstrated by reproducing the known press ure induced structural transitions in RbI, KI and a new structural phase tr ansition in AuGa2 above 10 GPa. Various softwares have also been developed to analyze data from this detector.