C. Amatore et al., Mapping concentration profiles within the diffusion layer of an electrode Part I. Confocal resonance Raman microscopy, ELECTROCH C, 2(4), 2000, pp. 235-239
Confocal microspectroscopy is known to be a very efficient means for probin
g composition of spatially resolved micrometric volumes inside a macroscopi
c sample. In this paper, the applicability of confocal Raman microspectrosc
opy for imaging molecular diffusion at microelectrodes with a micrometric r
esolution is established. The efficiency and versatility of the method have
been tested by probing the composition of the two different diffusion laye
rs which build up in the vicinity of an ultramicroelectrode during reductio
n of tetracyanoquinodimethane (TCNQ) on its first or second electrochemical
wave. This is performed by mapping the concentration profiles of the TCNQ(
.-)anion radical under each condition using its resonance Raman spectrum. A
s a correlation, this provides the first direct experimental proof of a con
proportionation reaction taking place when the electrode potential is poise
d on the second wave of a two-wave EE electrochemical system. In both cases
, the concentration profiles of the radical anion TCNQ(.-) agree extremely
well with theoretical predictions. (C) 2000 Elsevier Science S.A. All right
s reserved.