Estimation of current and voltage distributions by scanning coupling probe

This paper describes a method for estimating current and voltage distributi ons by scanning with a probe. The method takes advantage of the phenomenon that the coupling between the current and the probe varies with the directi on of the probe. The current and voltage are estimated by calculating the p robe Vector output for each of four directions. Both the current and voltag e vector distributions can thus be estimated at the same time by using a si ngle probe. The estimated distributions in a digital IC package and a micro strip line showed that this method produces reliable results. The simple st ructure of the probe should make it easy to reduce its size.