A novel optical technique for the measurement of temperature is proposed. T
his is accomplished by depositing alternating 1/4 wave layers of silicon ni
tride and silicon-rich silicon nitride at the end of an optical fiber. Thes
e layers of alternating refractive index form the equivalent of a Bragg gra
ting of a high temperature material. When the fiber and the Bragg grating a
re heated, the Bragg stack expands, and there is a change in the reflective
peak wavelength of this wave stack. Thus, the wavelength of peak reflectiv
ity is a function of temperature. Currently, the 15 nm spectral width of th
e Bragg stacks is achieved in our laboratory, which is conveniently monitor
ed with a CCD solid state spectrometer and the temperature sensor probes ca
n be also multiplexed at separated specific reflection wavelength. In the e
xperiment, the temperatures in excess of 1,100 centigrade have been measure
d with a resolution of less than 3 centigrade degree.