Luminescence characteristics of Er-doped GaN semiconductor thin films

Citation
Jm. Zavada et al., Luminescence characteristics of Er-doped GaN semiconductor thin films, J ALLOY COM, 300, 2000, pp. 207-213
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ALLOYS AND COMPOUNDS
ISSN journal
09258388 → ACNP
Volume
300
Year of publication
2000
Pages
207 - 213
Database
ISI
SICI code
0925-8388(20000412)300:<207:LCOEGS>2.0.ZU;2-V
Abstract
Semiconductors doped with rare earth atoms have been studied for more than a decade because of the potential of using them to develop compact and effi cient electroluminescence (EL) devices. Trivalent erbium ions (Er3+) are of special interest because they exhibit atomic-like transitions centered at 1540 nm, which corresponds to the low-loss window of silica-based optical f ibers. While EL devices, based on Er-doped Si and GaAs materials, have been fabricated, their efficiency remains too low for practical applications. S everal years ago an important observation was made that there was less detr imental temperature quenching of Er luminescence intensity for larger bandg ap host materials. Therefore, Er-doping of wide gap semiconductors, such as the m-V nitrides, appears to be a promising approach to overcoming the the rmal quenching of Er luminescence found in Si and GaAs. In particular, GaN epilayers doped with Er ions have shown a highly reduced thermal quenching of the intensity of the Er luminescence from cryogenic to elevated temperat ures. The remarkable thermal stability of the light emission may be due to the large energy bandgap of the material, as well as to the optical inactiv ity of the material defects in the GaN films. In this paper, recent data co ncerning the luminescence characteristics of Er-doped GaN thin films are pr esented. Two different methods have been used for Er-doping of the GaN film s: ion implantation and in situ doping during epitaxial growth. Both method s have proven successful for incorporation and optical activation of Er3+ i ons. Infrared photoluminescence spectra, centered at 1540 nm, have been mea sured for various Er-doped III-N films. Considerably different emission spe ctra, with different thermal quenching characteristics, have been observed, depending upon the wavelength of the optical pump and the Er-doping method . Defect-related absorption centers permit excitation of the Er ions using below-bandgap optical sources. Elemental impurities, such as O and C, in th e thin films have also been shown to influence the emission spectra and to lead to different optical characteristics. (C) 2000 Published by Elsevier S cience S.A. All rights reserved.