A new approach to the determination of optical constants and thickness of thin dielectric transparent films

A new calculating method to deduce optical constants n, k and thickness d f rom the fringe pattern of the transmission spectrum is proposed. In this me thod the optical parameters are determined using only one curve of the tran smission spectra even for thin films where n d < lambda/4. The method is de monstrated by experimental data obtained using evaporated vacuum deposited TiO2 thin film on a glass substrate. The experimental values are in very go od agreement with those calculated using the above described technique.