Threshold photoelectron spectroscopy in the inner-valence ionization region and photo-double ionization of SF6

Citation
Aj. Yencha et al., Threshold photoelectron spectroscopy in the inner-valence ionization region and photo-double ionization of SF6, J PHYS B, 33(5), 2000, pp. 945-954
Citations number
39
Categorie Soggetti
Physics
Journal title
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS
ISSN journal
09534075 → ACNP
Volume
33
Issue
5
Year of publication
2000
Pages
945 - 954
Database
ISI
SICI code
0953-4075(20000314)33:5<945:TPSITI>2.0.ZU;2-K
Abstract
The threshold photoelectron (TPE) spectrum of SF6 has been recorded over th e photon energy range 25-140 eV using synchrotron radiation and a penetrati ng-field electron spectrometer. In addition, the photo-double ionization sp ectrum of SF6 has been obtained over the energy range 30.7-49.3 eV using th e threshold photoelectrons coincidence technique. The TPE spectrum in the i nner-valence ionization region is found to be significantly different to th e conventional photoelectron spectrum in the same binding energy region. In direct autoionization of neutral Rydberg and shape-resonance states of SFs dominate the formation of the TPE spectrum. Inner-valence SF6+ ion states a ppear to play a major role in the formation of the SF62+ ion states. The on set of double ionization in SF6 was found to occur at 31.98 +/- 0.02 eV.