Surface geometric structure of chemically modified silica studied by direct atomic force microscopy (AFM) imaging and adsorption method

Citation
M. Fuji et al., Surface geometric structure of chemically modified silica studied by direct atomic force microscopy (AFM) imaging and adsorption method, LANGMUIR, 16(7), 2000, pp. 3281-3287
Citations number
34
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
LANGMUIR
ISSN journal
07437463 → ACNP
Volume
16
Issue
7
Year of publication
2000
Pages
3281 - 3287
Database
ISI
SICI code
0743-7463(20000404)16:7<3281:SGSOCM>2.0.ZU;2-X
Abstract
The relationship between wettability and surface geometric structure of mod ified silica particles and glass plates was investigated. Surface modificat ion was performed by the autoclave method with 1-dodecanol to control the s urface wettability. The preferential dispersion test proved that wettabilit y varied at a surface modification ratio of 20%, which coincided with the c hanging point of the geometric structure of modifier chains determined by t he adsorption method. The geometric structure was also evaluated by atomic force microscopy (AFM), and we could obtain the hexagonal packing of chains of the modifiers both in water and air at high surface modification ratio. Imaging of the surface of the nanosized particles on a glass plate was acc omplished in water by taking advantage of the hydrophobic attractive force, which was proved by adhesion force measurements.