Diamond nucleation on (111)-oriented monocrystalline silicon wafer was inve
stigated by hot filament chemical vapor deposition (HFCVD). The variation o
f nucleation density with time was determined. For a lower gas flow rate, t
he nucleation density-time curve comprises two parts, which represent the n
ucleation at surface defects and smoothly intact surface sites. For a highe
r gas flow rate, the distinction between the two parts in the curve tends t
o vanish. Diamond nucleation was enhanced by increasing the gas flow rate.
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