The interaction between dislocations and oxygen atoms in silicon has been s
tudied. The effect of immobilization of dislocations by the segregation of
oxygen to the dislocation core (dislocation locking) has been investigated
for different oxygen concentrations and annealing conditions. It has been r
evealed that oxygen locking of dislocations shows three different regimes o
f behaviour. A numerical model for the dislocation locking process of oxyge
n atoms has been presented and used to interpret the experimental results.
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