The dependence of the profile of a titanium substrate on the composition of the dielectric coating

Authors
Yurkov, NK Trusov, VA
Citation
Nk. Yurkov et Va. Trusov, The dependence of the profile of a titanium substrate on the composition of the dielectric coating, MEAS TECH R, 42(9), 1999, pp. 853-857
Citations number
2
Categorie Soggetti
Instrumentation & Measurement
Journal title
MEASUREMENT TECHNIQUES
ISSN journal
05431972 → ACNP
Volume
42
Issue
9
Year of publication
1999
Pages
853 - 857
Database
ISI
SICI code
0543-1972(199909)42:9<853:TDOTPO>2.0.ZU;2-U
Abstract
The change in the initial profile of a titanium substrate as a function of the composition of the insulation material of a thick-film coating formed o n it is investigated. The effects of the glass particle sizes and the compo sition of the insulation material on its electric and mechanical properties is established.