Evaluation of the plasticity effects in fracture along ductile/brittle inte
rfaces requires appropriate models for plastic dissipation in a ductile com
ponent. For thin ductile films, constitutive properties appropriate to the
small volumes involved are essential for adequate modeling. Here, yield str
ess is of primary importance. With nanoindentation, one can obtain both a l
arge strain flow stress as well as the far field yield stress representing
the small strain elastic-plastic boundary. Using these to estimate an appro
priate plastic strain energy density, the crack tip plastic energy dissipat
ion rates associated with the interfacial crack extension can be estimated
for a ductile film. With the preceding analysis, plasticity effects on the
interfacial toughness have been evaluated for external measures of strain e
nergy release rates as obtained from indentation tests using the axisymmetr
ic bilayer theory. Comparison involved RF sputtered 200- to 2000-nm-thick C
u interlayers between oxidized silicon and sputtered tungsten. Experimental
values for the Cu/SiO2 interface increased with Cu film thickness from 1 t
o 15 J/m(2). This was in qualitative agreement with the theoretical predict
ions for plastic energy dissipation rates. In contrast, first-order estimat
es suggest that the observed interfacial toughness increases cannot be attr
ibuted to either mode mixity effects or increased intrinsic interfacial fra
cture energies. As such, crack tip plasticity is identified as the dominant
mechanism for increasing interfacial toughness.