A higher order method of moments is presented for the analysis of microstri
p structures in a multilayer medium. It is shown that this higher order met
hod has a better convergence rate than the conventional lower order methods
. Therefore, to achieve the same accuracy, the higher order method requires
fewer unknowns. Several examples are gir:en ro demonstrate the accuracy an
d efficiency of this method. (C) 2000 John Wiley & Sons, Inc.